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EP1S60F1020I6

  • Available: 11618

Reference Price(In US Dollars)

QtyUnit PriceExt.Price
1+US $8.00000US $8.00
10+US $7.20000US $72.00
30+US $5.60000US $168.00
100+US $4.60000US $460.00
500+US $4.40000US $2200.00
1000+US $4.00000US $4000.00

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  • esd
  • as
  • iso14001
  • iso9001
  • D&B
  • Description
  • Alternatives
  • Shopping Guide
Description
This datasheet describes configuration devices for SRAM-based look-up table (LUT) devices.
Features Configuration devices for SRAM-based LUT devices offer the following features:
• Configures Altera ACEX 1K, APEX 20K (including APEX 20K, APEX 20KC, and APEX 20KE), APEX II, Arria GX, Cyclone, Cyclone II, FLEX 10K (including FLEX 10KE and FLEX 10KA) Mercury, Stratix, Stratix GX, Stratix II, and Stratix II GX devices
• Easy-to-use four-pin interface
• Low current during configuration and near-zero standby mode current
• Programming support with the Altera Programming Unit (APU) and programming hardware from Data I/O, BP Microsystems, and other third-party programmers
• Available in compact plastic packages
• 8-pin plastic dual in-line (PDIP) package
• 20-pin plastic J-lead chip carrier (PLCC) package
• 32-pin plastic thin quad flat pack (TQFP) package
• EPC2 device has reprogrammable flash configuration memory
• 5.0-V and 3.3-V in-system programmability (ISP) through the built-in IEEE Std. 1149.1 JTAG interface
• Built-in JTAG boundary-scan test (BST) circuitry compliant with IEEE Std. 1149.1
• Supports programming through Serial Vector Format File (.svf), Jam Standard Test and Programming Language (STAPL) Format File (.jam), JAM Byte Code File (.jbc), and the Quartus II and MAX+PLUS II softwares using the USB-Blaster, MasterBlaster, ByteBlaster II, EthernetBlaster, or ByteBlasterMV download cable
• Supports programming through Programmer Object File (.pof) for EPC1 and EPC1441 devices
• nINIT_CONF pin allows INIT_CONF JTAG instruction to begin FPGA configuration
Alternatives

Functional Equivalent (FE) materials, including Fused Filament Fabrication (FFF) form, assembly, and functionally compatible substitute materials.

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