SCANSTA111SMX/NOPB

The SCANSTA111SMX/NOPB is a high-performance scan path interface device manufactured by Texas Instruments. It is designed to facilitate testing and debugging of digital circuits, particularly in applications where integrated circuit (IC) testing is critical. Below is a detailed description of its features and specifications:

General Overview:

• Type: Scan Path Interface
• Manufacturer: Texas Instruments
• Package Type: Typically available in a small, surface-mount package (SMX), which allows for efficient use of PCB space and is suitable for automated assembly processes.

Key Features:

1. Scan Functionality: The SCANSTA111SMX/NOPB supports scan testing, which allows for the shifting of test data into and out of the device. This is essential for testing the internal states of digital circuits.

2. Multiple Scan Inputs/Outputs: The device typically includes multiple scan inputs and outputs, enabling it to connect with various scan chains in a system, thus enhancing the testing capabilities of complex digital designs.

3. High-Speed Operation: Designed for high-speed applications, the SCANSTA111SMX/NOPB can operate at fast clock rates, making it suitable for modern high-performance digital systems.

4. Low Power Consumption: The device is optimized for low power usage, which is crucial for battery-operated devices and applications where power efficiency is a priority.

5. Compatibility: It is compatible with various logic families, making it versatile for integration into different digital systems.

6. Enhanced Test Coverage: The SCANSTA111SMX/NOPB is designed to improve test coverage, allowing for more thorough testing of digital circuits, which can lead to higher reliability and reduced failure rates in production.

Electrical Characteristics:

• Supply Voltage: Typically operates within a specified voltage range (e.g., 1.8V to 5.5V), making it suitable for a variety of applications.
• Input/Output Voltage Levels: The device supports standard logic levels, ensuring compatibility with other components in the system.

Applications:

• Digital Circuit Testing: Primarily used in the testing of digital circuits, including microcontrollers, FPGAs, and ASICs.
• Debugging: Useful in debugging processes during the development phase of digital systems.
• Automated Test Equipment (ATE): Often integrated into ATE setups for efficient testing of multiple devices.

Packaging and Availability:

• Package Options: Available in various package types, including the small outline (SOIC) and other surface-mount configurations.
• RoHS Compliant: The NOPB designation indicates that the device is lead-free and compliant with RoHS standards, making it environmentally friendly.

Conclusion:

The SCANSTA111SMX/NOPB from Texas Instruments is a robust and versatile scan path interface device that plays a crucial role in the testing and debugging of digital circuits. Its combination of high-speed operation, low power consumption, and compatibility with various logic families makes it an essential component in modern electronic design and manufacturing processes.