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SN74BCT373DWR
- Manufacturer’s Part#:SN74BCT373DWR
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- Series:74BCT
- ECAD Model:
- Description:IC LATCH TRANSP OCTAL D 20SOIC
- Quantity:RFQAdd to RFQ List
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- Available: 10232
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- Description
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- Shopping Guide
The SN74BCT8244ADWR is a 8-bit Scan Test Device with Buffers from Texas Instruments' 74BCT series of Specialty Logic ICs. It is designed to be used in applications requiring a low-power, high-speed logic device.
Features:
• 8-bit Scan Test Device with Buffers
• Low-power, high-speed logic device
• Package-Case: 24-SOIC (0.295", 7.50mm Width)
• Series: 74BCT
• Packaging: Tape & Reel (TR) Alternate Packaging
• Supplier-Device-Package: 24-SOIC
• Operating-Temperature: 0°C ~ 70°C
• Mounting-Type: Surface Mount
• Supply-Voltage: 4.5 V ~ 5.5 V
• Logic-Type: Scan Test Device with Buffers
• Number-of-Bits: 8 BitsApplications:
The SN74BCT8244ADWR is suitable for use in applications such as data acquisition systems, industrial control systems, and medical instrumentation. It can also be used in applications requiring a low-power, high-speed logic device.
Functional Equivalent (FE) materials, including Fused Filament Fabrication (FFF) form, assembly, and functionally compatible substitute materials.
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